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Introducing the ADXL35x MEMS Accelerometers from Analog Devices Enabling Early Detection of Structural Defects, samples and eval kits available from Anglia

Analog Devices has launched a new three-axis, MEMS accelerometers that perform high resolution vibration measurement with very low noise to enable the early detection of structural defects via wireless sensor networks.

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This entry was posted by Anglia Components, on Monday, 12 June 2017.

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